苹果果实贮藏期间电学参数与品质指标的关系

食品科学 ›› 2013, Vol. 34 ›› Issue (2): 298-302.

苹果果实贮藏期间电学参数与品质指标的关系

安慧珍¹,马惠玲²,任小林¹,¹

1. 西北农林科技大学园艺学院
2. 西北农林科技大学

收稿日期:2011-11-06 修回日期:2012-12-14 出版日期:2013-01-25 发布日期:2013-01-15
通讯作者: 任小林 E-mail:rxl9152@yahoo.com.cn
基金资助:
农业部现代苹果产业技术体系

Relationship between Electrical Parameters and Quality Indexes of Apple Fruit During Storage

Received:2011-11-06 Revised:2012-12-14 Online:2013-01-25 Published:2013-01-15

摘要/Abstract

摘要： 以富士和秦冠苹果为材料，经过1-MCP或乙烯利处理，在0.1～3980 KHz范围内，用日置智能LCR仪测定果实贮藏期间10个电学参数的变化，并测量了苹果的硬度、可滴定酸和果皮色度等品质指标，分析了二者的关系。结果表明：随着频率的增加和贮藏时间的延长，复阻抗(Z)值均逐渐减小。富士苹果的Z值与可滴定酸相关性达到极显著水平。可用电学参数串联等效电阻(Rs)和Z值建立回归方程反映品质指标硬度、可滴定酸的变化，可通过相对介电常数(ε′)和Z值来预测苹果色度的变化，从而进行果品的无损检测。

Abstract: In order to investigate the correlation between the potential of dielectric properties and fruit internal quality, Fuji and Qin Guan apple treated with 1-methylcyclopropene (1-MCP) or ethephon were selected. An intelligent LCR Hioki tester was used to determine changes in 10 electrical parameters of the fruits with electric frequencies of 0.1～3980.0 KHz during apple fruit storage period. Quality indexes of firmness, titratable acid content, and peel chromaticity were also measured. Results showed that fruits presented a downswing of Z value as the electric frequency increased and the storage time extended. The Z value of Fuji apple could be significantly associated with titration acid content. Regression equations were built by correlation between electrical parameters of Rs, Z, and quality indexes of titration acid content and firmness; moreover, ε′ and Z could predict the change of peel chromaticity, and thus can measure for nondestructive-testing apples.

中图分类号:

S183

安慧珍马惠玲任小林. 苹果果实贮藏期间电学参数与品质指标的关系[J]. 食品科学, 2013, 34(2): 298-302.

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