Real-time Detection of Imperfect Wheat Grains on Wheat Pile Surface Based on IDS-YOLO
FAN Jiawei, WU Lan, YAN Jingjing
(1. College of Electrical Engineering, Henan University of Technology, Zhengzhou 450001, China;2. College of Electromechanical Engineering, Henan University of Technology, Zhengzhou 450001, China)
FAN Jiawei, WU Lan, YAN Jingjing. Real-time Detection of Imperfect Wheat Grains on Wheat Pile Surface Based on IDS-YOLO[J]. FOOD SCIENCE, 2024, 45(23): 268-277.