FOOD SCIENCE ›› 2002, Vol. 23 ›› Issue (5): 40-43.

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The Model of Vacuum and Far-Infrared Thin Layer Drying for Dnion

 XIAO  Xu-Lin   

  • Online:2002-05-15 Published:2012-02-13

Abstract: The thin Layer drying test was carried out by using a self-transforming vacuum and far-infrared device and this paper analyzed the test data with statistical method and has established a mathematics model.Statistics show that there is little difference between the speculated result and the calculated outcome,so that mathematics model equation established on these data can be used to describe the thin Layer drying for onion under self-transforming vacuum and far-infrared condition.

Key words: Vacuum and far-infrared , Onion , Thin Layer drying , Mathematics model