Abstract:

This paper describes a simple method for the determination of trace elements in pecans by using inductively
coupled plasma optical emission spectrometry (ICP-OES) and inductively coupled plasma spectrometry (ICP-MS).
HNO3 and H2O2 (V/V = 3:2) were used to achieve the complete decomposition of the organic matrix in a closed-vessel
microwave oven. The contents of 10 trace elements (B, Na, Mg, Al, Si, P, S, K, Ca and Fe) in pecans were determined
by ICP-OES while 18 trace elements (Li, Ti, V, Cr, Mn, Co, Ni, Cu, Zn, As, Rb, Sr, Mo, Cd, Sn, Sb, Ba and Pb) were
determined by ICP-MS. The soybean reference material (GBW10013) was used as the standard reference material. The
results revealed a good agreement between the measured and predicted values for all the analytes. The detection limits
of the 28 elements were in the range of 0.004 to 17.02 μg/L. The concentrations of essential microelements such as Ca,
Mg, P, K and S were higher. The method is highly accurate and precise and can meet the requirements for analysis of the
inorganic elements in pecan samples.

Key words: pecans, ICP-OES, ICP-MS, inorganic trace elements