食品科学 ›› 2013, Vol. 34 ›› Issue (11): 53-57.doi: 10.7506/spkx1002-6630-201311013

• 基础研究 • 上一篇    下一篇

电子束辐照对小麦营养品质和面团流变学特性的影响

陈云堂,李 湘,范家霖*,郭东权,商飞飞,吕晓华,张建伟,杨保安   

  1. 河南省科学院同位素研究所有限责任公司,河南省核农学重点实验室,河南 郑州 450015
  • 收稿日期:2012-02-17 修回日期:2013-04-22 出版日期:2013-06-15 发布日期:2013-06-03
  • 通讯作者: 范家霖 E-mail:twsywklxh@yahoo.com.cn
  • 基金资助:

    农业部公益性行业(农业)科研专项(201103007);河南省创新型科技人才队伍建设工程项目(豫科人事(2009)2号);
    郑州市创新型科技人才队伍建设工程项目(096SYJH28087);河南省重点攻关计划项目(122102110056)

Effect of Electron Beam Irradiation on Nutritive Quality and Dough Rheological Properties of Wheat Flour

CHEN Yun-tang,LI Xiang,FAN Jia-lin*,GUO Dong-quan,SHANG Fei-fei,LÜ Xiao-hua,ZHANG Jian-wei,YANG Bao-an   

  1. Key Laboratory of Nuclear Agriculture of Henan Province, Isotope Institute Co. Ltd., Henan Academy of Sciences, Zhengzhou 450015, China
  • Received:2012-02-17 Revised:2013-04-22 Online:2013-06-15 Published:2013-06-03
  • Contact: FAN Jia-lin E-mail:twsywklxh@yahoo.com.cn

摘要:

采用0、0.83、1.56、2.30、4.93 kGy不同剂量的电子束辐照小麦麦仁,研究其对小麦营养品质、面筋质量和面团流变学特性影响。结果表明,不同剂量的电子束辐照对小麦的蛋白质含量、氨基酸组成与平衡性影响不明显(p>0.05),对湿面筋含量、出粉率无明显影响(p>0.05),但沉淀值、降落数值均随着辐照剂量的增加而下降(p<0.05)。电子束辐照对面团的吸水量、拉伸度(E135')影响不明显(p>0.05),但面团弱化度随着辐照剂量的增加而增加(p<0.05)。与未辐照组相比,2.30、4.93 kGy时面团形成时间、稳定时间明显下降(p<0.05),0.83、1.56 kGy时面团的最大拉伸阻力(135')、50 mm处最大拉伸阻力(135')显著增强(p<0.05),0.83 kGy时面团的拉伸能量(135') 明显提高(p<0.05)。0.83、1.56 kGy的辐照剂量有利于小麦粉面团筋力的增强和加工品质的改善。

关键词: 电子束辐照, 小麦, 营养品质, 粉质特性, 拉伸特性

Abstract:

Wheat grains were irradiated by electron beam at doses of 0, 0.83, 1.56, 2.30 kGy and 4.93 kGy and the nutritive
quality and dough rheological properties were inestigated afterwards. The protein content and amino acid composition
of wheat kernels before and after irradiation were quite similar. Wet gluten content and flour yield were not significantly
changed by electron beam irradiation (P > 0.05) while sedimentation value and falling number significantly decreased as
the electron beam irradiation dose increased (P < 0.05). Irradiation treatment showed no significant effect on the water
absorption and extensibility of dough after 135 min of proofing whereas increased irradiation dose led to an increase
in degree of softening (P < 0.05). Compared to non-irradiated wheat, the development time and stability of dough were
significantly decreased at 2.30 kGy and 4.93 kGy (P < 0.05), while maximum resistance to extension after 135 min of proofing
and resistance to constant deformation after 50-mm stretching were significantly enhanced at 0.83 kGy and 1.56 kGy (P < 0.05).
Dough extension area after 135 min of proofing significantly increased at 0.83 kGy (P < 0.05). These results showed that electron
beam irradiation at 0.83 kGy and 1.56 kGy could enhance dough strength and improve the processing quality of wheat flour.

Key words: electron beam irradiation, wheat, nutritive quality, farinograph property, extensograph property

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